HI-Q™ Optical Test Measurement System


OEwaves’ HI-Q Optical Test Measurement System utilizes a homodyne methodology for automated measurement capable of testing ultra-low phase noise laser sources. The user friendly test system is capable of rapidly measuring <10 Hz of Lorentzian linewidth of a laser source without the complicated setup typically required to make such a narrow linewidth measurement.

This homodyne based system is unique in wide band measurement without requiring another low noise reference laser source. The complete system operates with ease, speed and precision, and a simple graphic user interface via a PC, without requiring any additional test equipment. The unmatched ultra-low phase/frequency noise analyzer system is scalable to various input wavelengths and capable of low relative intensity noise (RIN) measurement.


  • Ultra-Low Phase/Frequency Noise Measurement Capability
  • Fast Real-Time Measurement
  • Instantaneous and Extended FWHM Linewidth Analysis
  • No Low Noise Reference Source Required
  • User Friendly Interface
  • Simple PC-based Operation
  • 3U x 19” Rack System
  • Customizable Configurations, Upgrades, and Options


  • Multiple Input Wavelength Bands within 630 nm-2.2 µm
  • Ultra-low Noise Floor
  • RIN Measurements
  • Extended offset Frequency Range up to 2 GHz
  • Extended Input Power Range
  • Remote Operation
  • Performance Level and Frequency
  • Range Options and Upgrades


Phase Noise Floor: -140 ± 2 dBc/Hz @ >1 MHz

Optical Input Power Range: +5 to + 15 dBm

Offset Frequency Range: 10 Hz - 1 MHz

Resolution Bandwidth: 0.1 Hz - 200 kHz

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