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OE4001

Hi-Q Laser RIN Analyzer

The OEwaves’ HI-Q® OE4001 Optical Test Measurement System (TMS) offers a fully automated measurement of ultra-low RIN (Relative Intensity Noise) CW laser sources.

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HI-Q® RIN Analyzer is capable of automatically and rapidly measuring relative intensity noise spectrum without complex setup.

​This system is unique in wideband measurement. The complete system operates with ease, speed and precision via a simple graphic user interface on a dedicated PC. No additional test equipment required. The unmatched ultra-low relative intensity noise analyzer is scalable to various input wavelength bands and is available with multiple frequency range options. This system is ideal for manufacturing and research environments.

​Hi-Q Laser RIN Analyzer

Features

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  • Ultra-Low Relative Intensity Noise Measurement

  • Fast Real-time Measurement

  • User Friendly Interface

  • Simple PC-based Operation

  • 3U x 19” Rack System

Specifications

  • Ultra-low total RIN Floor -161 dBc/Hz and -166 dBc/Hz for Excess RIN option

  • Optical Input Power Range +5 to +15 dBm (SM-FC/APC)

  • Offset Frequency Range 100MHz – 18GHz, 27GHz or 40GHz 1Hz – 100MHz available in OE4000

  • Measurement Type Relative Intensity Noise

  • Data Storage and I/O HDD/USB Port

  • Operating Temperature Range 15°C to 35°C

  • Power 110/120 or 220/240 Vac; 50/60Hz

  • Size 3U x 19: Rack Mount Larger for 40GHz option

Optional Configurations

  • Excess laser RIN measurement option where shot and thermal noises are removed

  • Multiple Input Wavelength Bands
    within 740 nm – 2150 nm

  • Ultra-Low Noise Floor

  • Extended Frequency Range up to
    40 GHz

  • Extended Input Power Range

  • Remote Operation

  • Range Options and Upgrades

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