OE4001
HI-Q® LASER RIN TEST AND MEASUREMENT SYSTEM
The OEwaves’ HI-Q ® OE4001 Relative
Intensity Noise (RIN) Analyzer offers a fully automated measurement of ultra-low RIN CW lasers.
Understand the noise sources of your high-speed optical data transmission lasers, quantum sensing system, quantum computer, or high finesse interference measurement system by adding ultra-low RIN measurements to your measurement toolkit.
The complete system operates with ease, speed and precision via a simple graphic user interface on an embedded PC accessible via user-supplied external PC or monitor/keyboard/mouse.
Factory PC option shown
Specifications
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Ultra-Low Relative Intensity Noise Measurement
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Fast Real-time Measurement
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Fully Automated
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Frequency Ranges From 100 MHz to 18 GHz, 27 GHz, or 40 GHz. Inquire about other options.
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User Friendly Interface
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Simple PC-based Operation
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3U to 6U 19” Rack System, Depending on Configuration
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Customizable Configurations, Upgrades, and Options
Features
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Input Power Range: +0 to + 10 dBm
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Excess RIN Measurement Option, Excludes Shot and Thermal Noise.
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Multiple Wavelength Ranges
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Lowest RIN Floor Available
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Remote Control for Industrial System Integration
Applications
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Optimize Lasers for High Data Rate Transmission
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Characterize Photonic Integrated Circuits (PIC)
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AM Noise Measurements
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Extended Input Power Range
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Optical Input
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Performance Level and Frequency Range Options and Upgrades