As high-performance lasers continue to find broader applications in optical communications, quantum technology, and photonic chips and integrated circuits (PICs), our customers have expressed the need for expanded frequency coverage to analyze relative intensity noise (RIN). In response, we are pleased to introduce our newest and highest-frequency RIN analyzer.
The new OE4001 HI-Q® RIN Analyzer offers an ultra-low noise floor of < -168 dBc/Hz (Optional Excess RIN; thermal and shot noise excluded) and supports multiple wavelength bands, now extending up to 85 GHz. It features a user-friendly PC interface for seamless operation.
A key advantage of this system is its flexible, customizable configuration. Customers can integrate the RIN analyzer front-end with their existing spectrum or signal analyzers, enabling a cost-effective, high-frequency RIN measurement solution. This approach eliminates the need for internal digital circuits, reducing costs while extending frequency range capabilities to 85 GHz.
Like all OEwaves Laser Noise Analyzers, the OE4001 simplifies RIN measurements—both total and excess RIN can be analyzed with a single click using its intuitive graphical user interface (GUI). This streamlined approach removes the complexities associated with traditional RIN test setups. Additionally, the OE4001 supports remote operation via a local area network (LAN) or virtual private network (VPN), allowing users to send queries, receive data, and execute custom command scripts for testing and monitoring.
For more information or to discuss your laser noise test and measurement needs, contact our experts at sales@oewaves.com.