OE4001

Hi-Q® Laser RIN Analyzer

The OEwaves’ HI-Q® OE4001 Optical Test Measurement System (TMS) offers a fully automated measurement of ultra-low RIN (Relative Intensity Noise) CW laser sources.

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Features and Specifications

Features

Ultra-low relative intensity noise measurement
Fast real-time measurement
User-friendly interface
Simple PC-based operation
3U x 19” Rack System

Specifications

Ultra-low total RIN floor: -161 dBc/Hz and -166 dBc/Hz for excess RIN option
Optical input power range: +5 to +15 dBm (SM-FC/APC)
Offset frequency range: 100 MHz – 18 GHz, 27 GHz, 40 GHz, 54 GHz, or 67 GHz. (1 Hz – 100 MHz available in OE4000)
Measurement type: Relative intensity noise
Operating temperature range: 15 °C to 35 °C
Power: 110/120 or 220/240 Vac; 50/60 Hz
Size: 3U x 19
Rack mount larger for 40 GHz option
Data storage and I/O HDD/USB port

Optional Configurations

Excess laser RIN measurement option where shot and thermal noises are removed
Multiple input wavelength bands within 740 nm – 2150 nm
Ultra-low noise floor
Extended frequency range up to 67 GHz
Extended input power range
Remote operation
Range options and upgrades

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OE4001

Hi-Q® Laser RIN Analyzer

Features and Specifications

Features

Specifications

Optional Configurations

Product Intro

Request a Quote

Datasheet Request Form

OE4001

Hi-Q® Laser RIN Analyzer

Features and Specifications

Features

Specifications

Optional Configurations

Product Intro

Request a Quote